DARE65T radiation-hardened space SoC design platform
نویسندگان
چکیده
منابع مشابه
A novel radiation hardened by design latch ∗
Due to aggressive technology scaling, radiation-induced soft errors have become a serious reliability concern in VLSI chip design. This paper presents a novel radiation hardened by design latch with high single-eventupset (SEU) immunity. The proposed latch can effectively mitigate SEU by internal dual interlocked scheme. The propagation delay, power dissipation and power delay product of the pr...
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With the RH1280 and RH1020, Actel Corporation introduces radiation-hardened versions of the popular A1280 and A1020 field programmable gate array (FPGA) familes with equivalent gate densities of 8,000 and 2,000 gate array gates, respectively. These products are processed to the QML process flow as defined in MIL-PRF-38535. They are manufactured with a 0.8 micron, two-level metal epitaxial bulk ...
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Both in the commercial and in the aerospace domain, the continuous increase of transistor density on a single die is leading towards the production of more and more complex systems on a single chip, with an increasing number of components. This brought to the introduction of the System-On-Chip (SoC) architecture, that integrates on a single circuit all the elements of a full system. This strive...
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The Radiation Hardened Electronics for Space Environments (RHESE) project consists of a series of tasks designed to develop and mature a broad spectrum of radiation hardened and low temperature electronics technologies. Three approaches are being taken to address radiation hardening: improved material hardness, design techniques to improve radiation tolerance, and software methods to improve ra...
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i ABSTRACT Radiation hardening by design (RHBD) has become a necessary practice when creating circuits to operate within radiated environments. While employing RHBD techniques has tradeoffs between size, speed and power, novel designs help to minimize these penalties. Space radiation is the primary source of radiation errors in circuits and two types of single event effects, single event upsets...
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ژورنال
عنوان ژورنال: ELECTRONICS: Science, Technology, Business
سال: 2018
ISSN: 1992-4178
DOI: 10.22184/1992-4178.2018.179.8.122.128